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              <p>To determine the dielectric properties of ferroelectric thin-films over a wide range of frequencies we developed a simple and efficient method based on the measurement of coplanar waveguide realized on ferroelectric/dielectric heterostructures by using a Spectral Domain Approach. We applied this method to KTa1−xNbxO3 (KTN) thinfilms deposited on different substrates. The strong differences observed in the dielectric behavior of KTNs according to the growth substrate suggest that it is affected not only via the resulting microstructure, but also by the induced strains. Accuracy of the method was estimated to 15 and 10% on permittivity and loss tangent, respectively.</p>
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            <ref type="url">https://www.univ-rennes.fr/</ref>
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        </org>
        <org type="institution" xml:id="struct-117606" status="VALID">
          <idno type="ROR">https://ror.org/04xaa4j22</idno>
          <orgName>Institut National des Sciences Appliquées - Rennes</orgName>
          <orgName type="acronym">INSA Rennes</orgName>
          <desc>
            <address>
              <addrLine>20, avenue des Buttes de Coësmes - CS 70839 - 35708 Rennes cedex 7</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.insa-rennes.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-301232" type="direct"/>
          </listRelation>
        </org>
        <org type="regroupinstitution" xml:id="struct-301232" status="VALID">
          <idno type="IdRef">162105150</idno>
          <orgName>Institut National des Sciences Appliquées</orgName>
          <orgName type="acronym">INSA</orgName>
          <desc>
            <address>
              <country key="FR"/>
            </address>
          </desc>
        </org>
        <org type="institution" xml:id="struct-300373" status="VALID">
          <idno type="ROR">https://ror.org/01h0ffh48</idno>
          <orgName>Ecole Nationale Supérieure de Chimie de Rennes</orgName>
          <orgName type="acronym">ENSCR</orgName>
          <desc>
            <address>
              <country key="FR"/>
            </address>
          </desc>
        </org>
        <org type="institution" xml:id="struct-341038" status="VALID">
          <idno type="IdRef">232435103</idno>
          <idno type="ISNI">000000010626358X</idno>
          <idno type="ROR">https://ror.org/02cte4b68</idno>
          <orgName>Institut de Chimie - CNRS Chimie</orgName>
          <orgName type="acronym">INC-CNRS</orgName>
          <date type="start">2009-10-01</date>
          <desc>
            <address>
              <addrLine>CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE3 rue Michel-Ange75794 PARIS CEDEX 16 - France</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.cnrs.fr/inc</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>